《Ieee Transactions On Computer-aided Design Of Integrated Circuits And Systems》雜志影響因子:2.7。
期刊Ieee Transactions On Computer-aided Design Of Integrated Circuits And Systems近年評(píng)價(jià)數(shù)據(jù)趨勢(shì)圖
期刊影響因子趨勢(shì)圖
以下是一些常見的影響因子查詢?nèi)肟冢?
(1)Web of Science:是查詢SCI期刊影響因子的權(quán)威平臺(tái),收錄全球高質(zhì)量學(xué)術(shù)期刊,提供詳細(xì)的期刊引證報(bào)告,包括影響因子、分區(qū)、被引頻次等關(guān)鍵指標(biāo)。
(2)?Journal Citation Reports (JCR):JCR是科睿唯安旗下的一個(gè)網(wǎng)站,提供了期刊影響因子、引用數(shù)據(jù)和相關(guān)指標(biāo)。用戶可以在該網(wǎng)站上查找特定期刊的影響因子信息。
(3)中科院SCI期刊分區(qū)表:提供中科院分區(qū)的期刊數(shù)據(jù)查詢,包括影響因子和分區(qū)信息。
《Ieee Transactions On Computer-aided Design Of Integrated Circuits And Systems》雜志是由Institute of Electrical and Electronics Engineers Inc.出版社主辦的一本以工程技術(shù)-工程:電子與電氣為研究方向,OA非開放(Not Open Access)的國(guó)際優(yōu)秀期刊。
該雜志出版語言為English,創(chuàng)刊于1982年。自創(chuàng)刊以來,已被SCIE(科學(xué)引文索引擴(kuò)展板)等國(guó)內(nèi)外知名檢索系統(tǒng)收錄。該雜志發(fā)表了高質(zhì)量的論文,重點(diǎn)介紹了COMPUTER SCIENCE, HARDWARE & ARCHITECTURE在分析和實(shí)踐中的理論、研究和應(yīng)用。
?學(xué)術(shù)地位:在JCR分區(qū)中位列Q2區(qū),中科院分區(qū)為計(jì)算機(jī)科學(xué)大類3區(qū),COMPUTER SCIENCE, HARDWARE & ARCHITECTURE計(jì)算機(jī):硬件小類3區(qū)。
期刊發(fā)文分析
機(jī)構(gòu)發(fā)文量統(tǒng)計(jì)
機(jī)構(gòu) | 發(fā)文量 |
UNIVERSITY OF CALIFORNIA SYSTEM | 66 |
TSINGHUA UNIVERSITY | 51 |
DUKE UNIVERSITY | 47 |
CHINESE UNIVERSITY OF HONG KONG | 37 |
UNIVERSITY OF TEXAS SYSTEM | 37 |
CHINESE ACADEMY OF SCIENCES | 36 |
INDIAN INSTITUTE OF TECHNOLOGY SYSTEM (IIT... | 34 |
STATE UNIVERSITY SYSTEM OF FLORIDA | 29 |
NATIONAL TSING HUA UNIVERSITY | 28 |
PURDUE UNIVERSITY SYSTEM | 24 |
國(guó)家 / 地區(qū)發(fā)文量統(tǒng)計(jì)
國(guó)家 / 地區(qū) | 發(fā)文量 |
USA | 434 |
CHINA MAINLAND | 291 |
Taiwan | 74 |
GERMANY (FED REP GER) | 67 |
South Korea | 47 |
India | 45 |
France | 36 |
Canada | 30 |
England | 30 |
Austria | 28 |
期刊引用數(shù)據(jù)次數(shù)統(tǒng)計(jì)
期刊引用數(shù)據(jù) | 引用次數(shù) |
IEEE T COMPUT AID D | 426 |
IEEE T VLSI SYST | 134 |
IEEE T COMPUT | 106 |
IEEE J SOLID-ST CIRC | 68 |
P IEEE | 55 |
IEEE DES TEST | 52 |
LAB CHIP | 47 |
ACM T DES AUTOMAT EL | 44 |
ACM T EMBED COMPUT S | 40 |
IEEE T PARALL DISTR | 35 |
期刊被引用數(shù)據(jù)次數(shù)統(tǒng)計(jì)
期刊被引用數(shù)據(jù) | 引用次數(shù) |
IEEE T COMPUT AID D | 426 |
IEEE T VLSI SYST | 259 |
IEEE ACCESS | 255 |
INTEGRATION | 140 |
ACM T DES AUTOMAT EL | 95 |
J CIRCUIT SYST COMP | 89 |
IEEE T COMPUT | 78 |
IEEE T CIRCUITS-I | 69 |
ACM T EMBED COMPUT S | 62 |
J ELECTRON TEST | 62 |
文章引用數(shù)據(jù)次數(shù)統(tǒng)計(jì)
文章引用數(shù)據(jù) | 引用次數(shù) |
Resource Management for Improving Soft-Err... | 50 |
Angel-Eye: A Complete Design Flow for Mapp... | 42 |
NeuroSim: A Circuit-Level Macro Model for ... | 34 |
QoS-Adaptive Approximate Real-Time Computa... | 28 |
Adjusting Learning Rate of Memristor-Based... | 26 |
YodaNN: An Architecture for Ultralow Power... | 23 |
The Promise and Challenge of Stochastic Co... | 20 |
An Efficient Methodology for Mapping Quant... | 18 |
DeepThings: Distributed Adaptive Deep Lear... | 17 |
Affinity-Driven Modeling and Scheduling fo... | 17 |